The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2007

Filed:

Jan. 03, 2003
Applicants:

Antonio V. Bacarella, Dallas, TX (US);

David W. Davis, Little Rock, AR (US);

Timothy E. Ostromek, Richardson, TX (US);

Inventors:

Antonio V. Bacarella, Dallas, TX (US);

David W. Davis, Little Rock, AR (US);

Timothy E. Ostromek, Richardson, TX (US);

Assignee:

Litton Systems, Inc., Woodland Hills, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A system and method for combining image data are disclosed. Sensor data sets () are received from sensors (). An image metric () with slots () is generated by repeating the following for each sensor data set () until a final slot () of the image metric () is reached: generating display data from a subset of a sensor data set () for a slot () of the image metric, and generating display data from a subset of a next sensor data set () for a next slot () of the image metric (). An image generated from the image metric () is displayed.


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