The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2007
Filed:
Dec. 14, 2005
Hiroyuki Takagi, Takahagi, JP;
Katsutoshi Satoh, Hitachi, JP;
Hiroyuki Takagi, Takahagi, JP;
Katsutoshi Satoh, Hitachi, JP;
Hitachi, Ltd., Tokyo, JP;
Abstract
The present invention provides a computed tomography system that only requires rotational scans for image pickup, the system enabling images of a plurality of testing objects to be simultaneously picked up without increasing the volume of noise or the scale of the system, thus enabling high-quality tomographic images to be efficiently picked up. In the computed tomography system, a plurality of turn tablestoare provided in a region of irradiation with X-ray beams emitted by an X-ray irradiation system. Testing objects Ma to Md are placed on the respective turn tables. Images of the plurality of testing objects can be simultaneously picked up by irradiation with X-ray beams. This enables precise image pickup to be efficiently achieved without increasing the size of the scale.