The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2007

Filed:

May. 04, 2005
Applicants:

Ignazio Martines, Tremestieri Etneo, IT;

Davide Torrisi, Acireale, IT;

Inventors:

Ignazio Martines, Tremestieri Etneo, IT;

Davide Torrisi, Acireale, IT;

Assignee:

STMicroelectronics S.r.l., Agrate Brianza, IT;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G11C 7/02 (2006.01); G11C 11/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A circuit verifies and substitutes a defective reference cell of a memory device that includes at least one reference current path including the reference cell and a decoding transistor connected in series. The circuit includes at least one redundant reference current path identical to the at least one reference current path and in parallel therewith. A connection circuit connects in a mutually exclusive way control terminals of the decoding transistor and reference cell of the at least one reference current path to a node or control terminals of the decoding transistor and reference cell of the at least one redundant reference current path to the node. The connecting is based upon a logic signal. A window comparator is coupled to the reference current path for comparing a current therein with a pair of upper and lower thresholds, and outputs the logic signal for the connection circuit based upon the comparison.


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