The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 13, 2007
Filed:
Aug. 31, 2004
Karl Arthur Flechsig, Los Gatos, CA (US);
Donald Ray Gillis, San Jose, CA (US);
Sylvia Lui Lee, San Jose, CA (US);
Karl Arthur Flechsig, Los Gatos, CA (US);
Donald Ray Gillis, San Jose, CA (US);
Sylvia Lui Lee, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
An electrical test probe has a thermally activated, configurable shape probe tip. At low temperatures, the probe tip is in a generally hooked configuration. Upon heating, the probe tip is converted to a generally straight configuration. The probe tip is composed of a spring component bonded to a shape memory alloy component. The straight configuration allows placement of the probe between tightly spaced circuit pins, while the hooked configuration provides for tight gripping of a circuit pin during measurement.