The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 13, 2007

Filed:

Dec. 04, 2003
Applicants:

Alexander Schnell, Ennetbaden, CH;

Giampiero Antonelli, Monza, IT;

Klaus Germerdonk, Ennetbaden, CH;

Inventors:

Alexander Schnell, Ennetbaden, CH;

Giampiero Antonelli, Monza, IT;

Klaus Germerdonk, Ennetbaden, CH;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C21D 1/55 (2006.01);
U.S. Cl.
CPC ...
Abstract

It is disclosed a method of measuring the thickness and/or the depletion of Al and Cr of a γ/γ' MCrAlY-coating after the use in a high temperature environment, the γ/γ MCrAlY-coating exhibiting a non-equilibrium γ/γ′-microstructure at a temperature lower than the temperature during operation. Before the coating conductivity by means of a multifrequency eddy current system is measured a heat treatment is applied to transform the non-equilibrium γ/γ′-microstructure to a equilibrium microstructure having a α-Cr phase. Subsequently the Al and/or Cr depletion of the coating from the coating conductivity and permeability is determined.


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