The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2007

Filed:

Oct. 06, 2003
Applicants:

Xiaolan Ai, Massillon, OH (US);

Orestes J. Varonis, North Canton, OH (US);

Wen-ruey Hwang, North Canton, OH (US);

Inventors:

Xiaolan Ai, Massillon, OH (US);

Orestes J. Varonis, North Canton, OH (US);

Wen-Ruey Hwang, North Canton, OH (US);

Assignee:

The Timken Company, Canton, OH (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01P 5/00 (2006.01); G01P 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for measuring the speed of a target object passing a pair of sensor units () displaced apart by a predetermined distant L in the direction of motion of the target object (). Passage of one or more features of the target object () past the first sensor unit (A) results in the generation of a signal (x), and passage of the same feature of the target object () past the second sensor unit (B) results in the generate of a second signal, (x). A signal processor () is configured to determine a mathematical correlation between signals (x) and (x), and an associated time delay (τ). The speed (v) of the target object () is calculated by the signal processor () as the ratio of the predetermined distance (L) to the time delay (τ).


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