The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2007

Filed:

Jan. 30, 2004
Applicants:

Stéphane Rougeault, Sceaux, FR;

Pierre Ferdinand, Houilles, FR;

Inventors:

Stéphane Rougeault, Sceaux, FR;

Pierre Ferdinand, Houilles, FR;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/26 (2006.01); G02B 6/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

Extensometer with flexible test specimen and Bragg gratings applied in particular to the monitoring of concrete structures, is configured to measure deformations of a host material and comprises at least one test specimen which undergoes linear bending stresses, and at least one Bragg grating formed in an optic fibre and fixed to the test specimen. The extensometer configured such that any deformation of the host material is transmitted to the grating via the test specimen. The extensometer also comprises mechanical means which transform deformation of the material into bending of the test specimen, which deforms the grating.


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