The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2007
Filed:
Sep. 20, 2002
John Mcewen, Legal Representative, Porter, TX (US);
Bahjat Zafer, Sunnyvale, CA (US);
Pauline Bolte, San Jose, CA (US);
Ara Patapoutian, Westborough, MA (US);
Kelly Fitzpatrick, Sudbury, MA (US);
Steve Stupp, Los Altos, CA (US);
John McEwen, legal representative, Porter, TX (US);
Bahjat Zafer, Sunnyvale, CA (US);
Pauline Bolte, San Jose, CA (US);
Ara Patapoutian, Westborough, MA (US);
Kelly Fitzpatrick, Sudbury, MA (US);
Steve Stupp, Los Altos, CA (US);
Maxtor Corporation, Longmont, CO (US);
Abstract
A media noise optimized (MNO) detector for a read channel compensates for pattern dependent media noise, and compensates for nonlinearities from many sources such as residual MR nonlinearity, residual nonlinear transition shift, partial erasure, write-induced nonlinearity, and steady-state mis-equalization. The MNO detector is implemented by adjusting a conventional Viterbi detector branch metric so that the channel output value (ideal value) can be a nonlinear function of the state/branch bits, and the branch metric scaling factor is a function of the state/branch. For a given state/branch, the ideal value is the mean of analog-to-digital converter samples for the pattern corresponding to the state/branch, and the branch metric scaling factor is proportional to the noise variance for the pattern corresponding to that state/branch.