The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2007
Filed:
Nov. 05, 2001
Jean-paul Roger, Quincy Sous Senart, FR;
Albert Claude Boccara, Paris, FR;
Christian Bergaud, Toulouse, FR;
Marie-claude Potier, Asnieres sur Seine, FR;
Jean-Paul Roger, Quincy Sous Senart, FR;
Albert Claude Boccara, Paris, FR;
Christian Bergaud, Toulouse, FR;
Marie-Claude Potier, Asnieres sur Seine, FR;
Centre National de la Recherche Scientifique (C.N.R.S.), Paris Cedex, FR;
Abstract
The invention concerns an apparatus for parallel detection of the behaviour of mechanical micro-oscillators interacting with the sample (). The amplitude and the phase of resonance of micro-oscillators () are measured with optical means. The invention is characterised in that a source () is active during a fraction 1/n of the period (n being an integer) and of variable phase p/n of the period (p being an integer). Interferences are produced between light beams generated by reflection of incident light beams () and () on the micro-oscillators (). Periodically the micro-oscillators () are displaced by means. The value of the parameter p (p being an integer) is varied and N elementary measurements are integrated to obtain a measurement representing each of the values of p. The phase and amplitude of each micro-oscillator () are calculated on the basis of the representative data obtained for each value of p and this for a large number of accumulations. The invention is applicable in the field of nanotechnologies.