The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7173657 B1

PDF
Full Text
Expired
Date of Patent:
Feb. 06, 2007

Filed:

Mar. 22, 2001
Applicants:

Naoya Katoh, Chiba, JP;

Noboru Ohta, Rochester, NY (US);

Shuxue Quan, Rochester, NY (US);

Mitchell Rosen, Rochester, NY (US);

Inventors:

Naoya Katoh, Chiba, JP;

Noboru Ohta, Rochester, NY (US);

Shuxue Quan, Rochester, NY (US);

Mitchell Rosen, Rochester, NY (US);

Assignees:

Rochester Institute of Technology, Rochester, NY (US);

Sony Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N 5/335 (2006.01); H04N 5/228 (2006.01); G06K 9/00 (2006.01); G03F 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and system for analyzing a color rendering capability of at least one color imaging device with multiple color channels obtaining includes obtaining spectral sensitivity curves for two or more of the multiple color channels in the color imaging device and determining an image quality value for the color imaging device from the spectral sensitivity curves for the two or more of the multiple color channels in the color imaging device.


Find Patent Forward Citations

Katoh, Naoya. (2007). System and method for analyzing, optimizing and/or designing spectral sensitivity curves for an imaging device (U.S. Patent No. 7173657). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7173657

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