The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2007

Filed:

Nov. 16, 2005
Applicant:

Gil M. Raz, Concord, MA (US);

Inventor:

Gil M. Raz, Concord, MA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 1/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of nonlinear and affine signal processing includes the steps of introducing an input signal into a system which exhibits nonlinear behavior, the input signal including a target signal and a secondary signal. By virtue of its nonlinear design, the system generates nonlinear artifacts of the target signal and the secondary signal. These nonlinear artifacts are in turn used as a novel form of signal diversity. In one embodiment, the identification of the nonlinear artifacts is used to resolve defects that have been created as a result of sub-Nyquist sampling. In another embodiment, the identification of the nonlinear artifacts is used to locate and strengthen the power of a target signal that falls beneath the noise threshold for the system.


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