The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 06, 2007

Filed:

Aug. 28, 2004
Applicant:

Landon Duval, Huntington Beach, CA (US);

Inventor:

Landon Duval, Huntington Beach, CA (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 23/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A spectrometer for infrared reflectance measurements of samples for identification of the sample materials is built into a steering wheel assembly. The spectrometer includes a window and optics on a bench adjacent the window, so that the optics will be aligned with the sample when the device is placed in optical alignment with or directly against the sample. The optics include a broad-band IR light source (ordinary lamp) shining onto an acousto-optic tunable filter (AOTF), which passes narrow-band IR light with a swept frequency; a lens focusing the IR through the window onto the sample; and a reflectance detector aligned with the window of the spectrometer to pick up reflected light. A computer, which may be mounted in the spectrometer, compares the detected reflectance spectrum with stored sample data spectra, and identifies the material or the components of the material and their proportions. When a control substance is detected an alarm signal is produced.


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