The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2007
Filed:
Nov. 08, 2004
Applicant:
Akito Kishida, Tokyo, JP;
Inventor:
Akito Kishida, Tokyo, JP;
Assignee:
Agilent Technologies, Inc., Palo Alto, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/02 (2006.01);
U.S. Cl.
CPC ...
Abstract
There is provided a prober that includes a chuck, a support base that supports the chuck, a first inner shield that shields the chuck, and an outer shield that encloses the chuck and the first inner shield. The outer shield is connected to a chassis, the chuck is connected to a first connector by a first cable, and the first inner shield is connected to a second connector by a second cable with an impedance device in between.
Quick Actions:
Kishida, Akito. (2007). Probing apparatus and test method including electrical shielding (U.S. Patent No. 7173440). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7173440
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile