The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Feb. 06, 2007
Filed:
Jul. 26, 2005
Shanlin Duan, Fremont, CA (US);
Jizhong He, San Jose, CA (US);
Zhupei Shi, San Jose, CA (US);
Jane Jie Zhang, San Jose, CA (US);
Shanlin Duan, Fremont, CA (US);
Jizhong He, San Jose, CA (US);
Zhupei Shi, San Jose, CA (US);
Jane Jie Zhang, San Jose, CA (US);
Hitachi Global Storage Technologies Netherlands B.V., Amsterdam, NL;
Abstract
A magnetic test module runs on a spin stand to detect amplitude decay and noise evolution at the same time. Signal-to-noise ratio (SNR) decay is directly measured. The recording performance is correlated better with SNR instead of signal only. The thermal stability of the system is evaluated more accurately with this SNR decay method. A heater is placed under the media disk, and a remote sensing thermometer and temperature controller form a subsystem to set up desired environmental temperature. The heater creates a heated band and the read/write head flies above the heated band. The temperature control system may be removed when SNR decay measurement is performed under room temperature.