The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Aug. 21, 2002
Grace Kwan-on AU, Rancho Palos Verdes, CA (US);
May Wat Pederson, San Diego, CA (US);
Sang-luen Helen Fan, Los Angeles, CA (US);
Grace Kwan-On Au, Rancho Palos Verdes, CA (US);
May Wat Pederson, San Diego, CA (US);
Sang-Luen Helen Fan, Los Angeles, CA (US);
NCR Corp., Dayton, OH (US);
Abstract
A method and computer program are disclosed for measuring the parallelism of an execution step. The method includes determining whether the step operates on rows whose primary index is specified. If the primary index is specified, the parallelism is measured as single. If the primary index is not specified, the method determines whether the step uses an output from a previous step. If an output is used, the number of rows in the output is compared to a specified number. If the number of rows is greater than the specified number, the parallelism is measured as total. In one implementation, the geography of the output is determined and the previous step is compared to specified types such that if the primary index is not specified, the number is rows is not greater than a specified number, the geography does not write output rows to all parallel units, and the previous step is of a specified type, then the parallelism is measured as partial.