The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Jul. 15, 2003
Applicants:
G. William Walster, Cupertino, CA (US);
Eldon R. Hansen, Los Altos, CA (US);
Inventors:
G. William Walster, Cupertino, CA (US);
Eldon R. Hansen, Los Altos, CA (US);
Assignee:
Sun Microsystems, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 7/60 (2006.01);
U.S. Cl.
CPC ...
Abstract
One embodiment of the present invention provides a system that computes interval parameter bounds from fallible measurements. During operation, the system receives a set of measurements z, . . . , z, wherein an observation model describes each zas a function of a p-element vector parameter x=(x, . . . , x). Next, the system forms a system of nonlinear equations z−h(x)=0 (i=1, . . . , n) based on the observation model. Finally, the system solves the system of nonlinear equations to determine interval parameter bounds on x.