The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Nov. 18, 2004
Burkhard Groh, Chicago, IL (US);
Volker Heer, 96163 Gundelsheim, DE;
Mathias Hömig, 91058 Erlangen, DE;
Bernhard Sandkamp, 91054 Erlangen, DE;
Burkhard Groh, Chicago, IL (US);
Volker Heer, 96163 Gundelsheim, DE;
Mathias Hömig, 91058 Erlangen, DE;
Bernhard Sandkamp, 91054 Erlangen, DE;
Other;
Abstract
An X-ray device () is provided including an X-ray source () and a first X-ray detector () for producing a first X-ray image data set of an examination object (P). A second X-ray detector () is provided for producing a second X-ray image data set of examination object (P) where the second X-ray detector () has a smaller detector surface () than the first X-ray detector (). The second X-ray detector () may produce an X-ray image associated with the second X-ray image data set that has a higher local resolution than the X-ray image () associated with the first X-ray image data set. The second X-ray detector () may be movably connected with the first X-ray detector () so the second X-ray detector () maybe articulated upstream of the first X-ray detector ().