The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Aug. 05, 2005
Yoshiyuki Tani, Neyagawa, JP;
Hiroshi Iwamoto, Toyonaka, JP;
Takao Hisazumi, Ibaraki, JP;
Yukihiro Iwata, Ibaraki, JP;
Etsuyoshi Sakaguchi, Ibaraki, JP;
Yoshiyuki Tani, Neyagawa, JP;
Hiroshi Iwamoto, Toyonaka, JP;
Takao Hisazumi, Ibaraki, JP;
Yukihiro Iwata, Ibaraki, JP;
Etsuyoshi Sakaguchi, Ibaraki, JP;
Matsushita Electric Industrial Co., Ltd., Osaka, JP;
Abstract
The concentration(s) of element(s) contained in an unknown sample is measured without necessity of judging the sample relying on a human's eye and obtaining information from a supplier of the sample previously. The concentration(s) of trace element(s) such as Cd, Pb and Hg contained in parts for electronic or electric equipment is determined by (1) irradiating the sample with an X-ray so as to identify whether the type of the sample is a nonmetal-based material or a metal-based material; (2) selecting measuring conditions for a fluorescent X-ray analysis depending on the identified type of the sample; and (3) measuring the concentration(s) of one or more element(s) contained in the sample by the fluorescent X-ray analysis according to the selected measuring conditions.