The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Mar. 15, 2005
Byung-in MA, Suwon, KR;
Byoung-ho Choi, Suwon, KR;
Chong-sam Chung, Suwon, KR;
In-sik Park, Suwon, KR;
Tae-yong Doh, Suwon, KR;
Byung-in Ma, Suwon, KR;
Byoung-ho Choi, Suwon, KR;
Chong-sam Chung, Suwon, KR;
In-sik Park, Suwon, KR;
Tae-yong Doh, Suwon, KR;
Samsung Electronics Co., Ltd., Suwon-si, KR;
Abstract
An error signal detection method includes detecting light incident through an objective lens after having been reflected and diffracted from a recording medium, as eight light portions in a matrix including four inner light portions and four outer light portions, wherein the rows and columns of the matrix are parallel to the tangential and radial direction of the recording medium, respectively; calculating a first sum signal by summing a detection signal from at least one outer light portion located in a first diagonal direction, and a detection signal from an inner light portion located in a second diagonal direction; calculating second sum signal by summing a detection signal from an inner light portion located in the first diagonal direction, and a detection signal from an outer light portion located in the second diagonal direction; and comparing phases of the first and second sum signals to detect a tilt error signal.