The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2007

Filed:

Jul. 30, 2003
Applicants:

Ju-yi Lee, Taipei, TW;

Hsueh-ching Shih, Sijhih, TW;

Inventors:

Ju-Yi Lee, Taipei, TW;

Hsueh-Ching Shih, Sijhih, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 11/02 (2006.01); G01B 9/02 (2006.01); G01N 21/41 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention relates to a scanning ultrasound detection device using two-wave mixing in photorefractive crystal interferometry. An interferometer with two-wave mixing in photorefractive crystal, and cooperates with a confocal lenses module to perform a scan and inspection of the surface of a target. A rotating unit is used for directing a signal beam for detection to be incident upon different locations of the target. The confocal lens module is used to compensate any changes of reflection path caused by the signal beam having different incident angles. Hence, a reflected signal beam and a reference beam can strike on a photo detector.


Find Patent Forward Citations

Loading…