The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Apr. 20, 2000
Applicant:
Claire Elizabeth Hooper, Legal Representative, Newport Beach, CA (US);
Inventor:
Claire Elizabeth Hooper, legal representative, Newport Beach, CA (US);
Assignee:
Packard Instrument Company, Inc., Meriden, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 3/30 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and apparatus for the measurement of radiation, especially fluorescence from samples in assays, wherein a plurality of micro-sample light emitting sites are imaged simultaneously onto a detector array by a plurality of miniature objectives, one for each sample site and focussed thereon, producing parallel beams of light arranged in parallel and spaced apart, which beams are focussed at a pinhole aperture and then reconstituted as parallel beams for incidence on the detector array.