The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2007

Filed:

Mar. 10, 2004
Applicants:

Thomas L Mydlack, Rochester, MA (US);

Paul a Furze, Tiverton, RI (US);

Inventors:

Thomas L Mydlack, Rochester, MA (US);

Paul A Furze, Tiverton, RI (US);

Assignee:

Acushnet Company, Fairhaven, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/88 (2006.01); G06K 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention is directed to a method of inspecting a curved object comprising the steps of acquiring inspection image data of a curved object using a detector, generating adjusted image data by adjusting the inspection image data, and comparing the adjusted image data with digitally generated image data of a predetermined image. In one embodiment, golf balls are inspected using a line scan camera and a line of coplanar and parallel, diffuse light that uniformly illuminates the camera's scan line. A method of digitally filtering brightness in a digital image is also disclosed.


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