The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Aug. 12, 2004
Applicants:
Sung-tek Kahng, Daejon, KR;
Jong-won Eun, Daejon, KR;
Seong-pal Lee, Daejon, KR;
Inventors:
Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/06 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
Abstract
An apparatus and method for detecting a defect on a ground layer of microstrip by using scattering parameters is disclosed. The apparatus includes: a providing unit for providing a signal to the microstrip by changing a frequency of the signal in a predetermined range of frequencies; a detecting unit for detecting scattering parameters of an output signal from the microstrip in response to the frequency of the signal; and an analyzing unit for analyzing the interface based on the scattering parameters.