The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Aug. 02, 2004
Christian Muehlig, Jena, DE;
Wolfgang Triebel, Jena-Cospeda, DE;
Gabriela Toepfer, Jena, DE;
Regina Martin, Jena, DE;
Christian Muehlig, Jena, DE;
Wolfgang Triebel, Jena-Cospeda, DE;
Gabriela Toepfer, Jena, DE;
Regina Martin, Jena, DE;
Schott AG, Mainz, DE;
Abstract
A method is described for quantitative determination of suitability of an optical material, especially alkali halide and alkaline earth halide single crystals, for optical components exposed to high energy densities, especially of pulsed laser light at wavelengths under 250 nm. In this procedure radiation-dependent transmission of the optical material is determined at ultraviolet wavelengths by fluorescence measurements for fluorescence induced by ultraviolet radiation at these ultraviolet wavelengths. This is accomplished by a method including determining an induced fluorescence maximum of a non-linear absorption process, measuring a slope (|dT/dH|) of a functional relationship representing the dependence of the radiation-dependent transmission on fluence (H) for the induced, fluorescence and determining radiation-dependent transmissions from this slope for particular fluence values.