The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 30, 2007
Filed:
Sep. 01, 2003
Pascal Heim, Bevaix, CH;
Pierre-françois Ruedi, Hauterive, CH;
Eric Fragniere, Neuchatel, CH;
Eric Grenet, Neuchatel, CH;
François Kaess, Eclepens, CH;
Pascal Heim, Bevaix, CH;
Pierre-François Ruedi, Hauterive, CH;
Eric Fragniere, Neuchatel, CH;
Eric Grenet, Neuchatel, CH;
François Kaess, Eclepens, CH;
Abstract
The invention relates to a method of calculating the local contrast at each pixel (P) in a network (M) of photosensitive pixels which are arranged in at least one dimension (x, y). The inventive method consists in, during successive image acquisition cycles, producing a signal which is representative of the local luminance at each pixel, said luminance-representative signals being integrated values of luminance values sensed by the respective pixels (p, p, p, p, p). The inventive method consists in: sampling the integrated values of the signals representing the luminance values at the pixels adjacent (p, p, p, p) to a considered pixel (p), said sampling taking place at an instant in the cycle when the integrated value of the luminance at the considered pixel (p) is equal to a pre-determined reference value; and determining the local contrast at the considered pixel (p) on the basis of values thus sampled.