The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2007

Filed:

Aug. 23, 2001
Applicants:

Naoya Motegi, Hitachinaka, JP;

Kiyotaka Saito, Hitachinaka, JP;

Tomonori Mimura, Tomobe, JP;

Inventors:

Naoya Motegi, Hitachinaka, JP;

Kiyotaka Saito, Hitachinaka, JP;

Tomonori Mimura, Tomobe, JP;

Assignees:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/01 (2006.01); G01N 33/50 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to the present invention, there is provided an automatic chemical analyzer which is capable of conducting investigation of the influence of contamination regardless of the knowledge or technical skill of the user, and can prevent the occurrence of errors of determination by letting the user know that a problem has arisen in the function of inhibiting the generation of contamination. The combination of items which has been judged to involve contamination is extracted (step S-), and it is decided whether or not the result of judgement is the same as those of the previous judgements (step S-). In the step S-, if the results disagree, it is judged that trouble arises in the mechanism for preventing the generation of contamination, i.e., cleaning mechanism in this case, and an alarm of 'trouble in cleaning mechanism' is given on the alarm display of a CRT. Thus, the state of the apparatus can be monitored regardless of the technical skill of the user, and it is possible to prevent the errors of determination from occurring due to an abnormality in the state of the apparatus.


Find Patent Forward Citations

Loading…