The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 30, 2007

Filed:

May. 14, 2004
Applicants:

Lara A. Gundel, Berkeley, CA (US);

Michael G. Apte, Berkeley, CA (US);

Anthony D. Hansen, Berkeley, CA (US);

Douglas R. Black, Oakland, CA (US);

Inventors:

Lara A. Gundel, Berkeley, CA (US);

Michael G. Apte, Berkeley, CA (US);

Anthony D. Hansen, Berkeley, CA (US);

Douglas R. Black, Oakland, CA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 37/00 (2006.01); G01N 23/00 (2006.01); G01N 25/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The apparatus described herein is a miniaturized system for particle exposure assessment (MSPEA) for the quantitative measurement and qualitative identification of particulate content in gases. The present invention utilizes a quartz crystal microbalance (QCM) or other mass-sensitive temperature compensated acoustic wave resonator for mass measurement. Detectors and probes and light sources are used in combination for the qualitative determination of particulate matter.


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