The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2007

Filed:

Feb. 19, 2003
Applicants:

Ching-chung Lai, Taipei, TW;

Hung-pin Chen, Taipei, TW;

Inventors:

Ching-Chung Lai, Taipei, TW;

Hung-Pin Chen, Taipei, TW;

Assignee:

Via Technologies Inc., Taipei, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H03M 13/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A chip test method is suitable for testing a universal serial bus host controller. First, the host controller and the client device are individually set in a test mode. Next, the client device performs a client-side test preparation action. In addition, the host controller performs a host-side test preparation action. The host controller sequentially outputs a number of requests to the client device. The client device, in response to the requests, outputs simulated responses individually to the host controller, wherein the simulated responses are selected from correct responses corresponding to the requests, possible faulty responses, and error responses that are possibly to be received by the host controller during actual operation. Finally, the host controller performs a verification test to verify whether the host controller works properly under the various simulated situations.


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