The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2007

Filed:

Dec. 22, 2003
Applicants:

Motoharu Miyake, Yokosuka, JP;

Hiroshi Inamura, Yokohama, JP;

Taro Ishikawa, Kawasaki, JP;

Kazuhisa Yokota, Yokohama, JP;

Osamu Takahashi, Kunitachi, JP;

Inventors:

Motoharu Miyake, Yokosuka, JP;

Hiroshi Inamura, Yokohama, JP;

Taro Ishikawa, Kawasaki, JP;

Kazuhisa Yokota, Yokohama, JP;

Osamu Takahashi, Kunitachi, JP;

Assignee:

NTT DoCoMo, Inc., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08C 25/02 (2006.01); H04L 1/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

A first elapsed time from transmission of a data segment until receipt of an acknowledgement is measured. A probability distribution of the first elapsed time is generated for a client deviceon the basis of the measured first elapsed time. A second elapsed time from retransmission of a data segment until receipt of an acknowledgement is measured. A probability distribution of the second elapsed time is generated for a client deviceon the basis of the measured first elapsed time. An estimation is made as to whether an acknowledgment pertains to which data segment on the basis of the generated probability distribution.


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