The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2007

Filed:

Jul. 12, 2002
Applicants:

Thomas Kronhamn, Hälsö, SE;

Åke Andersson, Mölndal, SE;

Inventors:

Thomas Kronhamn, Hälsö, SE;

Åke Andersson, Mölndal, SE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for an analysis tool for analysis of the sensor performance of a system of sensors, which method comprises analytical calculation of a sensor system's measurement characteristics at each point in a given geographical area. The method comprises obtaining performance parameters from N sensors that are in the system. The method is characterized in that a set of analytical performance parameters for the system is calculated by the performance parameters being fused irrespective of the different measurement characteristics of the sensors in the system with regard to the given performance parameters and in that the analytical parameters are used in the analysis of the performance of the sensor system. The invention also relates to a device for use of the method and to the use of the method and the device.


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