The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2007
Filed:
Oct. 16, 2003
Shigehiro Kinoshita, Tokyo, JP;
Toshiro Ishida, Tokyo, JP;
Yuzo Otsuka, Tokyo, JP;
Toshio Moriya, Tokyo, JP;
Shigehiro Kinoshita, Tokyo, JP;
Toshiro Ishida, Tokyo, JP;
Yuzo Otsuka, Tokyo, JP;
Toshio Moriya, Tokyo, JP;
Tetra Labal Holdings & Finance S.A., Pully, CH;
Abstract
The object of the invention is to provide a container inspection method and a container inspection device which is not container quality inspection by individual and operator's empirical approach, not influenced by operator's skillfulness, can eliminate human error such as missing when recording and error in writing, not based on operator's subjective judgment, whose result is objective, and easily and statistically stores objective data. The container inspection method and container inspection device comprises an inspection for a container formed of a web-like packaging laminated material, which includes peeling flaps from the container wall by a pre-processing unit, cutting the container wall to prepare a sampled body by a sampled body preparing unit, inspecting seal quality by a seal quality unit, inspecting seal zone by an image processing unit, and inspecting damage on the seal zone by a seal damage inspection unit.