The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2007
Filed:
May. 09, 2002
Nancy P. Camacho, Edison, NJ (US);
Mathias P. G. Bostrom, Scarsdale, NY (US);
Steve L. Bertha, New York, NY (US);
Nancy P. Camacho, Edison, NJ (US);
Mathias P. G. Bostrom, Scarsdale, NY (US);
Steve L. Bertha, New York, NY (US);
Hospital for Special Surgery, New York, NY (US);
Abstract
A method of evaluating the surface of a material that has a distinguishable infrared spectrum comprising (a) positioning an infrared fiber optic probe to be in contact with a surface of the sample or material at a region of interest for detecting attenuated total reflectance or within a sufficient distance from the surface of the region for detecting reflection, (b) detecting mid- or near-infrared radiation attenuated total reflectance or reflection off of the surface of the sample or the material, (c) analyzing the infrared radiation from step (b) for at least one of peak height, peak area, frequency and chemometric parameters, and (d) actuating the removal device when a signal from the infrared fiber optic probe is between pre-selected values for at least one of peak height, peak area, frequency and chemometric parameters for the sample of the material.