The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2007
Filed:
Dec. 03, 2001
Takayuki Abe, Matsudo, JP;
Shigeru Watanabe, Ibaraki-ken, JP;
Hirotaka Takeshima, Ryuugasaki, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
In a measuring space of the object (), an essential measurement region () having a center region of the measuring space and a plurality of peripheral measurement regions () which do not have any region overlapped with the essential measurement region are set. Then, the essential measurement region is combined with a selected peripheral portion of the plurality of the peripheral measurement regions to measure in a preceding manner a nuclear magnetic resonance signal from the object as data of the measuring space. The essential measurement region is combined with the peripheral measurement region of the plurality of the peripheral measurement regions which has not been selected in the preceding measuring step to measure a nuclear magnetic resonance signal from the object as data of the measuring space. Sequentially, the essential measurement region is combined with the peripheral measurement region having not been measured in a preceding measuring step to measure a nuclear magnetic resonance signal from the object. The data of the essential measurement region and the data of the peripheral measurement region thus measured is supplemented with the data of the peripheral measurement region measured in the preceding measuring step to generate data of the measuring space.