The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2007
Filed:
Nov. 19, 2004
Tom Bostoen, Antwerp, BE;
Thierry Pollet, Mechelen, BE;
Patrick Jan Maria Boets, Heffen, BE;
Leonard Pierre Van Biesen, Aalst, BE;
Tom Bostoen, Antwerp, BE;
Thierry Pollet, Mechelen, BE;
Patrick Jan Maria Boets, Heffen, BE;
Leonard Pierre Van Biesen, Aalst, BE;
Alcatel, Paris, FR;
Abstract
Methods for matching adaptive hybrids () to lines () for making reflectograms of the lines () measure () input impedances (Z) of the lines (), model () characteristic impedances of the lines () via physical models (Z), estimate () parameters of the physical models (Z) via cost functions which depend on the measured input impedances (Z), convert () the modelled characteristic impedances into impedance values (), and set () the adaptive hybrids () with the impedance values (). Unwanted near-end reflections are minimised and wanted reflections can be measured. The physical models depend on frequencies s, Bessel functions Jand parameters arelated to geometrical dimensions A, D and L and material constants σ, ε and μ of the lines (). The method may further model () characteristic impedances of the lines () via rational function models (Z) and estimate () parameters of the rational function models (Z) via further cost functions which depend on outcomes of the physical models (Z).