The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2007
Filed:
Jul. 18, 2003
Barry James Stagg, Acworth, GA (US);
Barry James Stagg, Acworth, GA (US);
Columbian Chemicals Company, Marietta, GA (US);
Abstract
Disclosed is a method for in-situ sampling and measuring particulate fineness in a process stream, comprising (a) sampling particles in-situ from a process stream, (b) adjusting the sample to conditions suitable for LII, (c) measuring the fineness using LII, and (d) correlating the LII fineness measurement with actual particle fineness. Also disclosed is a method for sampling and controlling a process based on the real-time, on-line, in-situ methods for sampling and measuring particles. Sampling can comprise drawing a sidestream from a source of the particles. Adjusting the sample to conditions suitable for LII can comprise diluting the sample or bringing the temperature of the sample to ambient conditions. Correlating may comprise using a correlation function determined by comparing LII measurements and laboratory fineness measurements for particle samples drawn at the same time.