The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2007
Filed:
Jul. 25, 2002
Masami Kidono, Tachikawa, JP;
Hitoshi Hashimoto, Sagamihara, JP;
Dai Kawase, Hino, JP;
Olympus Corporation, Tokyo, JP;
Abstract
An automatic exposure ('AE'), control apparatus to prevent exposure errors resulting from 'smear.' Image-capturing is performed at a single exposure time TI (I=1, 2, . . . n); a CCD output is applied with a CCD drive signal to perform an integrating operation for a signal in an AE area using an integration circuit, and then outputs integration value EI+SI at each exposure time. A shutter trigger operation presents readout of an exposure value. An integrator value En+Sn obtained just before the shutter trigger operation, and a smear value Sn' obtained just after the shutter trigger operation are provided to an exposure operation/control circuit. The exposure operation/control circuit then performs an AE operation to receive En+Sn−Sn≈En and compares the value to a target value for determining exposure conditions, and provides an AE operation value containing almost no smear component to determine an appropriate exposure condition.