The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2007

Filed:

Sep. 24, 2004
Applicants:

Marthinus Van Schoor, Medford, MA (US);

Andrew M. Cutler, Boston, MA (US);

Gert J. Muller, Arlington, MA (US);

Attila Lengyel, Cambridge, MA (US);

Brooks Radighieri, Dallas, TX (US);

Inventors:

Marthinus van Schoor, Medford, MA (US);

Andrew M. Cutler, Boston, MA (US);

Gert J. Muller, Arlington, MA (US);

Attila Lengyel, Cambridge, MA (US);

Brooks Radighieri, Dallas, TX (US);

Assignee:

Mide Technology Corporation, Medford, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 27/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and apparatus for determining an electrical property of a structure. The method involves creating a model of an electrical property of a structure and measuring the electrical property of the structure between at least two of a plurality of locations. The method also involves determining the electrical property of at least a portion of the structure based on the model and the measurement of the electrical property between the at least two of the plurality of locations.


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