The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 23, 2007

Filed:

Sep. 22, 2004
Applicants:

Carl L. Willis, Houston, TX (US);

David K. Schisla, Pleasant Prairie, WI (US);

Daniel E. Goodwin, Katy, TX (US);

Inventors:

Carl L. Willis, Houston, TX (US);

David K. Schisla, Pleasant Prairie, WI (US);

Daniel E. Goodwin, Katy, TX (US);

Assignee:

Kraton Polymers LLC, Houston, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C08L 53/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed is a process for preparing polymers and copolymer blocks of conjugated dienes with high amounts of branching, commonly referred to as vinyl content, comprising the use of at least two microstructure control agents. One of the microstructure control agents can be a bulk microstructure control agents such as diethyl ether. The other microstructure control agent is a specific microstructure control agent such as 1,2-diethoxypropane. The use of a bulk and a specific microstructure control agent together can allow for the production of high levels of vinyl content at high polymerization rates without the undesirable affects experienced with either one alone.


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