The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7166534 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 23, 2007

Filed:

Sep. 24, 2002
Applicant:

Tae-woo Jung, Kyoungki-Do, KR;

Inventor:

Tae-Woo Jung, Kyoungki-Do, KR;

Assignee:

Hynix Semiconductor Inc., Kyoungki-do, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01); H01L 21/3065 (2006.01);
U.S. Cl.
CPC ...
Abstract

Semiconductor manufacturing processes that reduce production costs as well as increase throughput by substituting the PR strip and ACT wet cleaning procedure after the via contact etching of a semiconductor with dry cleaning to be performed while removing a photoresist in a conventional PR strip apparatus. In addition, the methods can shorten waiting time and maintain consistency in the process by performing the PR strip and cleaning at the same time in the same chamber. The resultant devices have lower via contact resistance and its deviation, as compared to the conventional PR strip and ACT wet cleaning.


Find Patent Forward Citations

Jung, Tae-Woo. (2007). Method of dry cleaning photoresist strips after via contact etching (U.S. Patent No. 7166534). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7166534

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