The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 23, 2007
Filed:
Mar. 15, 2002
Gregory Kirk, Winchester, MA (US);
Matthew Brown, Watertown, MA (US);
Emanuele Ostuni, Cambridge, MA (US);
Enoch Kim, Boston, MA (US);
Bernardo Aumond, Cambridge, MA (US);
Olivier Schueller, Somerville, MA (US);
Paul Sweetnam, Marblehead, MA (US);
Brian Benoit, Westborough, MA (US);
Gregory Kirk, Winchester, MA (US);
Matthew Brown, Watertown, MA (US);
Emanuele Ostuni, Cambridge, MA (US);
Enoch Kim, Boston, MA (US);
Bernardo Aumond, Cambridge, MA (US);
Olivier Schueller, Somerville, MA (US);
Paul Sweetnam, Marblehead, MA (US);
Brian Benoit, Westborough, MA (US);
Surface Logix, Inc., Brighton, MA (US);
Abstract
The present invention discloses a test device including a support member; a top member mounted to the support member, wherein in the support member and the top member are configured such that they together define a discrete chamber. The discrete chamber includes a first well region including at least one first well; a second well region including at least one second well; and a channel region including at least one channel connecting the first well region and the second well region with one another. The second region is preferably horizontally offset with respect to the first well region in a test orientation of the device.