The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
Jan. 29, 2004
Applicant:
Yaniv Vakrat, Ashdod, IL;
Inventor:
Yaniv Vakrat, Ashdod, IL;
Assignee:
Sun Microsystems, Inc., Santa Clara, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Testing of computing devices is automated by recording each of the tests once, capturing user interface operations as a record, and then rerunning the tests repetitively and automatically on the same or different instances of the target device, substantially without human intervention. A successful test is indicated by identity of corresponding screens captured from a reference device and the target device.