The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2007

Filed:

Dec. 19, 2003
Applicants:

Sekhar G. Lakkapragada, San Jose, CA (US);

Ambujavalli Kesavan, San Jose, CA (US);

Inventors:

Sekhar G. Lakkapragada, San Jose, CA (US);

Ambujavalli Kesavan, San Jose, CA (US);

Assignee:

Sun Microsystems, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus, including computer program products, implementing and using techniques for testing a computing cluster having several computing nodes. Configuration information regarding a test system is received and used to generate a configuration file that profiles the test system. The configuration file may be passed to each computing machine in the test system whereupon an appropriate test suite is launched on each computing machine in the test system to perform the tests contemplated by the test suite.


Find Patent Forward Citations

Lakkapragada, Sekhar. (2007). Distributed test framework for clustered systems (U.S. Patent No. 7165189). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7165189

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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