The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
May. 08, 2002
Madhava V. Avvari, Cupertino, CA (US);
Philip A. Chin, San Jose, CA (US);
Murali K. Nandigama, San Jose, CA (US);
Uday S. Dhanikonda, San Jose, CA (US);
Madhava V. Avvari, Cupertino, CA (US);
Philip A. Chin, San Jose, CA (US);
Murali K. Nandigama, San Jose, CA (US);
Uday S. Dhanikonda, San Jose, CA (US);
Sun Microsystems, Inc., Santa Clara, CA (US);
Abstract
An intelligent test system for testing software code is provided. The intelligent system includes a profiled software component, a test executor, a database, a database updater, and a data analyzer/optimizer. The test executor creates a coverage data by using the profiled software component to execute a plurality of test cases of a test suite. The database stores the coverage data and the database updater is configured to store the coverage data into the database. The data analyzer/optimizer analyzes the coverage data contained in the database to find test cases affected by a modification to the software code. The data analyzer/optimizer also optimizes the test cases affected by the modification by selecting fewer test cases that satisfy a criteria. The test executor uses the test cases that satisfy the criteria to test the modification to the software code.