The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 16, 2007

Filed:

Nov. 08, 2005
Applicants:

Sassan Tabatabaei, Sunnyvale, CA (US);

Touraj Farahmand, Burnaby, CA;

Inventors:

Sassan Tabatabaei, Sunnyvale, CA (US);

Touraj Farahmand, Burnaby, CA;

Assignee:

Guide Technology, Inc., Sunnyvale, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 35/00 (2006.01); H04Q 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present subject matter relates to methodologies for providing error correction compensation to measurement systems. Data-dependant jitter may be compensated by examining both short-term and long-term bit histories after applying a predetermined synthesized calibration pattern having selected characteristics to the measurement system. Neural networks may be provided to produce error correction signals that may be applied to measured data on a bit-by-bit basis to correct jitter. The synthesized calibration sequence may correspond to a base pattern having two segments; a first segment may correspond to a copy of the base pattern while the second segment may be a copy of the base pattern with some sections inverted.


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