The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
Feb. 22, 2005
Applicant:
Lipeng Cao, Austin, TX (US);
Inventor:
Lipeng Cao, Austin, TX (US);
Assignee:
Freescale Semiconductor, Inc., Austin, TX (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/302 (2006.01);
U.S. Cl.
CPC ...
Abstract
One use for delay adjustment circuit (), coarse-grain delay offset circuit (), and fine grain delay systhesis circuit () may be as part of a delay replication circuit () used to replicate the frequency versus voltage behavior of an integrated circuit (). Also, a circuit () and method for determining optimal power and frequency metrics of integrated circuit () is also described. In addition, a method for determining programmable coefficients to replicate frequency and supply voltage correlation is described.