The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
Jun. 25, 2004
James Nabors, Wartburg, TN (US);
Brook Nash, Knoxville, TN (US);
Todd Schrock, Kingston, TN (US);
Dick Wyman, Knoxville, TN (US);
Norbert Hartwig, Waldems-Esch, DE;
Earl Smith, Seymour, TN (US);
Adam Williamson, Seymour, TN (US);
James Nabors, Wartburg, TN (US);
Brook Nash, Knoxville, TN (US);
Todd Schrock, Kingston, TN (US);
Dick Wyman, Knoxville, TN (US);
Norbert Hartwig, Waldems-Esch, DE;
Earl Smith, Seymour, TN (US);
Adam Williamson, Seymour, TN (US);
Smiths Detection, Inc., Alcoa, TN (US);
Abstract
An apparatus and method for non-destructive inspection of materials housed in containers involves orienting an X-ray beam emitter and detector to direct and detect an X-ray beam at an angle substantially parallel to a sloped surface of the container to be inspected. A first X-ray apparatus is located opposite a second X-ray apparatus, and both the first and second X-ray apparatus are adapted to provide two X-ray beams. This arrangement provides for imaging of the entire area of a sloped portion of the container without any shadow or hidden spots.