The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
Oct. 16, 2002
Petrus Theodorus Jutte, Eindhoven, NL;
Jacobus Maria Antonius Van Den Eerenbeemd, Eindhoven, NL;
Petrus Theodorus Jutte, Eindhoven, NL;
Jacobus Maria Antonius Van Den Eerenbeemd, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
An optical scanning device () for scanning an information layer () includes a radiation source () for supplying a radiation beam (), a lens system () having an optical axis (OO'), and a detection system) including: (i) an astigmatism generating element () for generating a first amount of astigmatism (W) represented by a vector (W, θ), so as to transform the radiation beam to a first astigmatic radiation beam (); (ii) an astigmatism correcting element () for generating a second amount of astigmatism (W) represented by a vector (W, θ), so as to transform the first astigmatic radiation beam to a second astigmatic radiation beam () having a third amount of astigmatism (W) represented by a vector (W, θ), and (iii) a detector () for transforming the second astigmatic radiation beam to an electrical signal. According to the invention, Wis adapted to the detector and that Wand θcomply substantially with the following equation: (W, 2θ)+(W, 2θ)=(W, 2θ).