The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
Oct. 14, 2003
Marc Bergendahl, Jericho, VT (US);
David Lewison, Larchmont, NY (US);
Raymond H. Puffer, Jr., Watervliet, NY (US);
Marc Bergendahl, Jericho, VT (US);
David Lewison, Larchmont, NY (US);
Raymond H. Puffer, Jr., Watervliet, NY (US);
Bausch & Lomb Incorporated, Rochester, NY (US);
Abstract
An optical device inspection system and method employing a narrow aperture on a magnifying objective lens in order to reduce the circle of confusion and increase the depth of field. The smaller aperture resulting in an increase in depth of field allows for simultaneous focus for all portions of objects being inspected. An arc lamp with an elliptical reflector in combination with a condenser lens focuses a more intense beam of light through the objective lens, thereby providing sufficient brightness without sacrificing any depth of field.