The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
Oct. 22, 2004
John Douglas Weir, Huntington, NY (US);
Donald Dimarzio, Northport, NY (US);
Steven Chu, Ronkonkoma, NY (US);
Robert P. Silberstein, New York, NY (US);
John Douglas Weir, Huntington, NY (US);
Donald DiMarzio, Northport, NY (US);
Steven Chu, Ronkonkoma, NY (US);
Robert P. Silberstein, New York, NY (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A system is disclosed which utilizes the substantially steady-state temperature of a coated object, in conjunction with an optical detection system, to selectively view defects and features of the object below the coating without the necessity of transient heating or IR illumination and reflectance imaging. The optical detector, such as an IR camera, may be tailored for the wavelengths at which the coating material is substantially transparent, thereby maximizing the viewing clarity of the defects and features under the coating, and distinguishing them from any spurious features on the top surface of the coating. The present system enables the inspection of small or large areas in real time, without requiring complex image acquisition, storage and image processing equipment and software.