The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 16, 2007
Filed:
Feb. 18, 2004
Applicants:
Dan Welsh, Encinitas, CA (US);
Joel Kindem, San Diego, CA (US);
Michael Gurley, San Diego, CA (US);
Richard L. Conwell, Del Mar, CA (US);
Inventors:
Dan Welsh, Encinitas, CA (US);
Joel Kindem, San Diego, CA (US);
Michael Gurley, San Diego, CA (US);
Richard L. Conwell, Del Mar, CA (US);
Assignee:
Digirad Corporation, Poway, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/00 (2006.01);
U.S. Cl.
CPC ...
Abstract
Events of interest are detected within a gamma ray detection system. Characteristics of undesired signals, including a multiplicity of events within the signal, a density of events within the signal, and other aspects are determined. The signal is filtered based on its expected characteristics. A signal which does not have the expected characteristics is rejected, and an image is formed that excludes those rejected signals.